Secondary Ion Mass Spectroscopy Tutorial


SIMS System

The following post is a Secondary Ion Mass Spectroscopy Spectroscopy (SIMS) Tutorial ( PowerPoint in PDF format) complements of Eric Krosche. Although a destructive technique, SIMS is also the most sensitive surface analysis technique with detection limits as low as parts per billion.


Additional SIMS tutorials:

Secondary Ion Mass Spectroscopy Wiki

Eagle Analytical Labs SIMS Theory

Note that the SIMS workshop links list of SIMS systems providers is missing a few companies such as Hiden and Extrel

Resources for Surface Analysis Techniques

ASTM International, formerly known as the American Society for Testing and Materials (ASTM), is a fantastic resource for Surface Analysis techniques including Auger Electron spectroscopy, X-ray photoelectron spectroscopy, Secondary ion mass spectroscopy, and Energy-dispersive-ray spectroscopy.

Using the search tool on the ASTM website you can easily find standards for anything from specimen mounting and preparation to data interpretation. Simply type in a keyword such as Auger, XPS, SIMS, EDX or SEM and you will get a listing of all standards with that keyword.

You can purchase the single standard that you are interested in or sign up for one of the many subscription options that are available.

If you can’t find what you need on their website you can contact ASTM at 1-877-909-ASTM