A blog on the repair, operation and calibration of surface analysis systems and components including electron spectrometers, sputter ion guns and vacuum related hardware. Click on the Index tab below to see a list of all posts. Visit our website at http://www.rbdinstruments.com
The following post is an Auger Electron Spectroscopy Tutorial (In PowerPoint format) complements of Eric Krosche. I think it is an excellent overview of the technique. Although AES is not as prevalent as it was back in the 70s and 80s, it is still a very useful surface analysis technique.
ASTM International, formerly known as the American Society for Testing and Materials (ASTM), is a fantastic resource for Surface Analysis techniques including Auger Electron spectroscopy, X-ray photoelectron spectroscopy, Secondary ion mass spectroscopy, and Energy-dispersive-ray spectroscopy.
Using the search tool on the ASTM website you can easily find standards for anything from specimen mounting and preparation to data interpretation. Simply type in a keyword such as Auger, XPS, SIMS, EDX or SEM and you will get a listing of all standards with that keyword.
You can purchase the single standard that you are interested in or sign up for one of the many subscription options that are available.
Or, if you do not have your own surface analysis instrument or SEM and want to outsource your analysis needs, you can find a surface analysis testing laboratory in your area by using the Laboratory Directory dialog box and select the Surface Analysis/Microscopy pull down menu. The menu has many other testing choices as well.
ASTM Laboratory Directory
If you can’t find what you need on their website you can contact ASTM at 1-877-909-ASTM
This topic is something that we still get regular requests for information about. I first wrote this tech tip back in 2004 to summarize the training that we perform when installing a PHI 660 scanning auger electron microprobe. It still comes in handy today, especially in university labs where the system operators change on a regular basis. AES Imaging Procedure
PHI 660 Scanning Auger with RBD 147 PC upgrade
The most common source of trouble with imaging on a PHI scanning auger electron microprobe is simply that it is time to replace the Lab6 filament. If you need a new filament for your older PHI scanning auger electron microprobe, RBD provides the filaments for about 1/2 of what they can cost elsewhere.
Still need some help imaging? Feel free to contact us for more information.