A blog on the repair, operation and calibration of surface analysis systems and components including electron spectrometers, sputter ion guns and vacuum related hardware. Click on the Index tab below to see a list of all posts. Visit our website at http://www.rbdinstruments.com
RBD has released Version 1 of CMapp – the data collection, analysis and control application for the microCMA. Of course, this is not the first version of CMapp available, but we had a set of features in mind for Version 1 that would truly represent the most feature-complete version of CMapp. Of course, this won’t be the last version – we’re already busy adding new features and working on a completely redesigned application for a future release.
The key new feature in CMapp 1.0 is the addition of the Electron Gun Control Pane, which replaces the dialog window. All of the electron gun controls are always available on-screen in the familiar layout. There’s no longer a need to move or minimize a window in order to view acquisition data.
Other Features and Changes
CMapp now offers the ability to differentiate and smooth data while acquiring. This is invaluable for getting important peak information in real-time, and removes the need to wait until the end of an acquisition to determine if the parameters are resulting in useful / expected data.
The latest version of CMapp also includes the ability of the edit the Wehnelt setpoints in the Hardware properties menu. Normally these values are factory set, but now they are easier to adjust without putting undo “stress” on the filament by ramping the beam voltage from 2 to 3 kV before having ballpark Wehnelt values.
Lastly, some minor changes have been made to improve the UI when working with Windows 11.
This past year there have been a number of new features added to CMapp – the application software for the microCMA. Most of these provide you with improved (and safer) control of your microCMA hardware. For example, there’s is now a “Dynamic Mode” feature that assists in automatically conditioning the multiplier.
The most significant addition to the CMapp software is the Multiplex Survey Region View.
Earlier versions of CMapp – like its AugerScan cousin – displayed Multiplex data in two ways – either individual survey region windows, or a bar graph representing the peak-to-peak or atomic concentration (a.c.) data.
The most recent version of CMapp (0.4) has an additional view, which displays the survey region data in one graph of kinetic energy vs. counts or concentration. It’s now much easier to visualize all of the survey data in one window. Additionally, the graph updates in real-time while acquiring, much like a single survey.
This latest feature was actually added to CMapp in a recent previous version, but we’ve updated it to provide the option to order data legend and atomic concentration table by energy, alphabetically, by descending atomic concentration, or by the order the regions were added to the acquisition.
You can change the order of regions in the legend (and in the optional atomic concentration annotation) in the View menu – choose the Options command, Graph tab:
You can find more information about RBD’s microCMA and download the latest version of CMapp here.
We’ll be soon be updating our YouTube channel with more microCMA tutorial videos to help you get the most out of your compact Auger analyzer and CMapp software.