Atomic Concentration Command
The Atomic Concentration command in the Data menu calculates atomic
concentrations for survey, multiplex, and depth profile data. This is currently
available for AES and XPS data only, not for SIMS data.
Applying the command produces different results depending on the acquisition
type displayed:
When a marked and differentiated survey is displayed, the atomic concentration
of each marked element is displayed next to the marker for that element. For
AES, you must first mark the elements in the survey and then differentiate the
data before calculating atomic concentrations. For XPS, you must first select
the endpoints to mark each peak that you want to include in the atomic
concentration calculation.
When a profile is displayed, the values displayed by the vertical axis of the
graph change. The label on the Y axis changes from N(E) to %. The label on
the X axis change only if you change the settings using the Profile Depth Units
command in the Data menu. For XPS data, you must select the endpoints for each
region before calculating the atomic concentration.
When a multiplex is displayed, the values displayed by the vertical axis of
the graph change. The label on the Y axis changes from N(E) to %. For XPS data,
you must select the endpoints for each region before calculating the atomic
concentration.
If an atomic concentration doesn’t seem accurate, you may need to change the sensitivity factors that AugerScan
uses to calculate it. This information is stored in the element tables for
each acquisition technique. Click here to see how to edit the element tables so that you can change the sensitivity
factors as needed.
You can create a table that shows the atomic concentrations you have
identified in a survey. The ability to create an Atomic Concentration Table, which is a
special type of annotation, is provided by the Options command in the View
menu. Select the Annotations tab in the View Options dialog box. An Atomic
Concentration Table can be edited, moved, and deleted like any annotation. Use the What’s This Help to get more information about the fields in the dialog box. For more
information about the Atomic Concentration Table, click here.
Another option available in the View Options dialog (Annotations tab) is
whether to display 1 or 2 decimal accuracy for atomic concentration. This affects
the concentration wherever it is displayed.
For XPS multiplexes, you can create a table that includes peak height, area,
FWHM, and atomic concentration. For more information, click here.
Note 1: For XPS and AES surveys, the atomic concentration calculation includes only
those element that you have marked. For XPS data, you must identify the endpoints.
Note 2: The analysis region for AES multiplex and depth profile regions is normally
the upper and lower limit of the region. However, you have the option of selecting endpoints for any or all regions in order to define the limits.