td@inl.gov<\/a> or by\ncalling 248-877-8866<\/p>\n","protected":false},"excerpt":{"rendered":"This technology is an ion beam profiler that can reconstruct the ion beam intensity in two dimensions with a single measurement device. There are many currently available commercial solutions, but they are overly complicated, require large manipulators that may not fit on existing systems, or require long scan times to profile the complete ion beam. This technology was conceived to use an inexpensive single-axis manipulator that can fit on the smallest standardized vacuum chamber port and provide a full beam profile construction quickly and with a single degree of motion and a single measurement device. Continue reading →<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":2906,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"jetpack_post_was_ever_published":false,"_jetpack_newsletter_access":"","footnotes":"","jetpack_publicize_message":"New Ion Beam Profiler -This technology is an ion beam profiler that can reconstruct the ion beam intensity in two dimensions with a single measurement device. 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The alignment principles explained here will apply to just about any surface analysis ion source. First, here is a video that explains all of the alignment\u2026","rel":"","context":"In "Ion Sources"","block_context":{"text":"Ion Sources","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/ion-sources\/"},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":1600,"url":"https:\/\/www.rbdinstruments.com\/blog\/measure-electron-current-accurately\/","url_meta":{"origin":2904,"position":2},"title":"Measure electron current accurately","author":"Randy","date":"December 12, 2015","format":false,"excerpt":"To measure electron current accurately (or ion current) you need to take secondary electrons out of the measurement. This is easy to do if you have a Faraday cup. The Faraday cup traps secondary electrons which results in an accurate beam current measurement. If secondary electrons are allowed to leave\u2026","rel":"","context":"In "Operation and Calibration Procedures"","block_context":{"text":"Operation and Calibration Procedures","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/operation-and-calibration-procedures\/"},"img":{"alt_text":"Secondary electron cutoff","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2015\/12\/Secondary-electron-cutoff.jpg?fit=899%2C574&ssl=1&resize=350%2C200","width":350,"height":200,"srcset":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2015\/12\/Secondary-electron-cutoff.jpg?fit=899%2C574&ssl=1&resize=350%2C200 1x, https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2015\/12\/Secondary-electron-cutoff.jpg?fit=899%2C574&ssl=1&resize=700%2C400 2x"},"classes":[]},{"id":345,"url":"https:\/\/www.rbdinstruments.com\/blog\/ion-beam-induced-low-energy-electrons\/","url_meta":{"origin":2904,"position":3},"title":"Ion Beam Induced Low Energy Electrons","author":"Randy","date":"February 6, 2013","format":false,"excerpt":"For the purpose of checking the performance of a surface analysis spectrometer such as a cylindrical mirror analyzer (CMA) or spherical capacitive analyzer (SCA), looking at an ion induced low energy electron peak can be extremely helpful. The peak typically occurs at about 20 to 50 eV and the size\u2026","rel":"","context":"In "Operation and Calibration Procedures"","block_context":{"text":"Operation and Calibration Procedures","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/operation-and-calibration-procedures\/"},"img":{"alt_text":"ion gun noise","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2013\/02\/Ion-gun-noise.png?resize=350%2C200&ssl=1","width":350,"height":200},"classes":[]},{"id":3668,"url":"https:\/\/www.rbdinstruments.com\/blog\/04-303-differential-aperture-improvement\/","url_meta":{"origin":2904,"position":4},"title":"04-303 Differential Aperture Improvement","author":"Randy","date":"January 24, 2023","format":false,"excerpt":"The differential aperture in the PHI 04-303 5kV ion source provides two functions: It helps to shape the ion beam. It restricts the gas in the ionizer, which is at a higher pressure, from entering the vacuum chamber. 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