{"id":1675,"date":"2016-03-10T06:14:12","date_gmt":"2016-03-10T14:14:12","guid":{"rendered":"http:\/\/www.rbdinstruments.com\/blog\/?p=1675"},"modified":"2016-03-26T06:35:18","modified_gmt":"2016-03-26T13:35:18","slug":"casaxps-scofield-rsfs","status":"publish","type":"post","link":"https:\/\/www.rbdinstruments.com\/blog\/casaxps-scofield-rsfs\/","title":{"rendered":"CASAXPS Scofield RSFs"},"content":{"rendered":"

Neal Fairley of CASA XPS has found that it is possible to quantify PHI (Physical Electronics) XPS data using Scofield cross-sections modified for escape depth and angular distribution. The Scofield-based library is then populated with universal RSFs applicable to PHI data. Videos on the CASAXPA website illustrate this point and how all XPS instruments can now use Scofield derived RSFs regardless of which instrument or manufacturer is involved.<\/p>\n

Below you will find links to videos that show CASAXPS in action.\u00a0\u00a0 CASAXPS can help you quantify your XPS data and achieve accurate interpretation of the data. For more information on CASAXPS in the U.S. please contact RBD Instruments at sale@rbdinstruments.com<\/a> or by calling 541 330 0723.<\/p>\n

I hope that you enjoy the videos!<\/p>\n

Simulating Spectra:<\/p>\n

Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Quantification of XPS Spectra:<\/p>\n

Transmission function, Escape Depth Correction and Relative Sensitivity Factors<\/p>\n

Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Quantification and the Influence of Overlay Material on Substrate Information<\/p>\n

Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Quantification of PHI Versa Probe Spectra<\/p>\n

Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Thin Film Estimate by Hill Equation:<\/p>\n

Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Step 1: Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Step 2: Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Step 3: Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Etch Time to Depth Calibration:<\/p>\n

Start Video Click Here<\/a> or Click Here for mp4 Mode<\/a><\/p>\n

Linear Least Squares Depth Profile Analysis<\/p>\n

Start Video Click Here<\/a> or Click Here of mp4 Mode<\/a><\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

Neal Fairley of CASA XPS has found that it is possible to quantify PHI (Physical Electronics) XPS data using Scofield cross-sections modified for escape depth and angular distribution. The Scofield-based library is then populated with universal RSFs applicable to PHI … Continue reading →<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":1677,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"jetpack_post_was_ever_published":false,"_jetpack_newsletter_access":"","footnotes":"","jetpack_publicize_message":"","jetpack_is_tweetstorm":false,"jetpack_publicize_feature_enabled":true,"jetpack_social_post_already_shared":true,"jetpack_social_options":{"image_generator_settings":{"template":"highway","enabled":false}}},"categories":[162],"tags":[40,212],"jetpack_publicize_connections":[],"jetpack_featured_media_url":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2016\/03\/CASAXPS.jpg?fit=286%2C181&ssl=1","jetpack_shortlink":"https:\/\/wp.me\/p2DEXo-r1","jetpack_sharing_enabled":true,"jetpack_likes_enabled":true,"jetpack-related-posts":[{"id":291,"url":"https:\/\/www.rbdinstruments.com\/blog\/casaxps-data-processing-software-for-xps\/","url_meta":{"origin":1675,"position":0},"title":"CasaXPS \u2013 Data processing software for XPS","author":"Randy","date":"January 9, 2013","format":false,"excerpt":"X-ray Photoelectron Spectroscopy or XPS (also known as ESCA, an abbreviation for Electron Spectroscopy for Chemical Analysis), has become one of the most prevalent surface analysis techniques for the characterization of solid surfaces in vacuum. 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The function of the electron multiplier is to increase the number of electrons that the analyzer\u2026","rel":"","context":"In "General Optics and Vacuum"","block_context":{"text":"General Optics and Vacuum","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/general-optics-and-vacuum\/"},"img":{"alt_text":"","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2013\/05\/channeltron-electron-multiplier.jpg?fit=203%2C267&ssl=1&resize=350%2C200","width":350,"height":200},"classes":[]},{"id":4154,"url":"https:\/\/www.rbdinstruments.com\/blog\/contact-issue-with-mcd-ceramic-on-phi-5600-xps-system\/","url_meta":{"origin":1675,"position":3},"title":"Contact issue with MCD ceramic on PHI 5600 XPS system","author":"Randy","date":"January 21, 2025","format":false,"excerpt":"This blog post shows how to repair an open POS connector on a 16 channel MCD anode ceramic used in the MCD detector on PHI 5600 thru 5800 XPS systems.","rel":"","context":"In "General Optics and Vacuum"","block_context":{"text":"General Optics and Vacuum","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/general-optics-and-vacuum\/"},"img":{"alt_text":"","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2025\/01\/Missing-gold-on-contact.jpg?fit=1200%2C1004&ssl=1&resize=350%2C200","width":350,"height":200,"srcset":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2025\/01\/Missing-gold-on-contact.jpg?fit=1200%2C1004&ssl=1&resize=350%2C200 1x, https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2025\/01\/Missing-gold-on-contact.jpg?fit=1200%2C1004&ssl=1&resize=700%2C400 2x, https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2025\/01\/Missing-gold-on-contact.jpg?fit=1200%2C1004&ssl=1&resize=1050%2C600 3x"},"classes":[]},{"id":4144,"url":"https:\/\/www.rbdinstruments.com\/blog\/xps-data-algorithms\/","url_meta":{"origin":1675,"position":4},"title":"XPS data algorithms","author":"Randy","date":"December 30, 2024","format":false,"excerpt":"Here is a link to a section of a PDF file that explains the math behind the most common data algorithms used in XPS. 282793_XPS_Data_Massage_Algorithms-4Download","rel":"","context":"In "Theory"","block_context":{"text":"Theory","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/theory\/"},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":684,"url":"https:\/\/www.rbdinstruments.com\/blog\/xps-analyzer-focal-point\/","url_meta":{"origin":1675,"position":5},"title":"XPS analyzer focal point","author":"Randy","date":"July 16, 2013","format":false,"excerpt":"This post will explain how to find the analyzer focal point on a PHI 5000 series XPS system and then align the system microscope to that point. 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