{"id":1389,"date":"2015-02-23T07:45:43","date_gmt":"2015-02-23T15:45:43","guid":{"rendered":"http:\/\/www.rbdinstruments.com\/blog\/?p=1389"},"modified":"2022-05-23T17:58:05","modified_gmt":"2022-05-24T00:58:05","slug":"bcf-database-aes","status":"publish","type":"post","link":"https:\/\/www.rbdinstruments.com\/blog\/bcf-database-aes\/","title":{"rendered":"BCF Database for AES"},"content":{"rendered":"

Version 1.0 of the Backscattering-Correction-Factor Database for Auger Electron Spectroscopy program provided by NIST provides BSFs of homogeneous materials.<\/p>\n

From the NIST website: This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy (AES). These BCFs are obtained from Monte Carlo simulations based on two models of electron transport in the material, a simplified model and an advanced model. One assumption for the former model is that the primary-electron beam is unchanged, in intensity, energy or direction, within the information depth for Auger-electron emission. This assumption becomes progressively less useful as the primary energy becomes closer to the core-level ionization energy for the relevant Auger transition or for increasing angles of incidence of the primary electrons.<\/p>\n

BCFs can be calculated from both models so that users can readily ascertain the magnitudes of differences in BCFs from each model for materials and analysis conditions of interest. Analysts can readily specify the experimental conditions of interest (primary-beam energy, primary-beam angle of incidence, and, for the advanced model, analyzer-acceptance solid angle), the likely or estimated sample composition, the subshell of the element to be ionized, one of three available formulae for the inner-shell ionization cross section, and, for the advanced model, the Auger-electron transition of interest. The user can also select different numbers of trajectories in the Monte Carlo simulations so that tradeoffs can be made between calculation time and precision of the resulting BCF value. While simulations with the simplified model are generally faster than those with the advanced model, BCFs from the advanced model are considered more reliable. The results of a BCF calculation can be stored in a file for later use.<\/p>\n

System Requirements<\/strong>: Personal computer operating on Windows 95, 98, NT, 2000, ME, XP, Vista, or 7, and hard disc space of at least 50 MB.System<\/p>\n

Price:<\/strong> No Charge<\/p>\n

You can download the program here – https:\/\/www-s.nist.gov\/srd_online\/index.cfm?fuseaction=home.main&productID=SRD154<\/a><\/p>\n

\u00a0<\/p>\n\n\n

<\/p>\n","protected":false},"excerpt":{"rendered":"

Version 1.0 of the Backscattering-Correction-Factor Database for Auger Electron Spectroscopy program provided by NIST provides BSFs of homogeneous materials. From the NIST website: This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by … Continue reading →<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":1390,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"jetpack_post_was_ever_published":false,"_jetpack_newsletter_access":"","footnotes":"","jetpack_publicize_message":"","jetpack_is_tweetstorm":false,"jetpack_publicize_feature_enabled":true,"jetpack_social_post_already_shared":true,"jetpack_social_options":{"image_generator_settings":{"template":"highway","enabled":false}}},"categories":[163],"tags":[173,174],"jetpack_publicize_connections":[],"jetpack_featured_media_url":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2015\/02\/nist.jpg?fit=336%2C150&ssl=1","jetpack_shortlink":"https:\/\/wp.me\/p2DEXo-mp","jetpack_sharing_enabled":true,"jetpack_likes_enabled":true,"jetpack-related-posts":[{"id":237,"url":"https:\/\/www.rbdinstruments.com\/blog\/auger-electron-spectroscopy-tutorial\/","url_meta":{"origin":1389,"position":0},"title":"Auger Spectroscopy","author":"Randy","date":"January 25, 2020","format":false,"excerpt":"A list of Auger Electron Spectroscopy tutorials","rel":"","context":"In "General Optics and Vacuum"","block_context":{"text":"General Optics and Vacuum","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/general-optics-and-vacuum\/"},"img":{"alt_text":"microCMA","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2020\/01\/microCMA.jpg?fit=500%2C308&ssl=1&resize=350%2C200","width":350,"height":200},"classes":[]},{"id":3027,"url":"https:\/\/www.rbdinstruments.com\/blog\/microcma-length-the-long-and-short-of-it\/","url_meta":{"origin":1389,"position":1},"title":"microCMA Length, the Long and Short of It","author":"Randy","date":"October 6, 2020","format":false,"excerpt":"RBD Instruments'' microCMA compact Auger electron spectrometer fits on a standard 2.75\" \/ 70 mm CF flange and the length can be customized as needed.","rel":"","context":"In "microCMA"","block_context":{"text":"microCMA","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/microcma\/"},"img":{"alt_text":"microCMA","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2020\/09\/microCMA-long-and-short.jpg?fit=1200%2C667&ssl=1&resize=350%2C200","width":350,"height":200,"srcset":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2020\/09\/microCMA-long-and-short.jpg?fit=1200%2C667&ssl=1&resize=350%2C200 1x, https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2020\/09\/microCMA-long-and-short.jpg?fit=1200%2C667&ssl=1&resize=700%2C400 2x, https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2020\/09\/microCMA-long-and-short.jpg?fit=1200%2C667&ssl=1&resize=1050%2C600 3x"},"classes":[]},{"id":54,"url":"https:\/\/www.rbdinstruments.com\/blog\/imaging-on-a-scanning-auger-electron-microprobe\/","url_meta":{"origin":1389,"position":2},"title":"Imaging on a PHI scanning auger electron microprobe","author":"Randy","date":"August 20, 2012","format":false,"excerpt":"This topic is something that we still get regular requests for information about. I first wrote this tech tip back in 2004 to summarize the training that we perform when installing a PHI 660 scanning auger electron microprobe.\u00a0 It still comes in handy today, especially in university labs where the\u2026","rel":"","context":"In "Theory"","block_context":{"text":"Theory","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/theory\/"},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":879,"url":"https:\/\/www.rbdinstruments.com\/blog\/32-100-electron-multiplier-supply-digital-mode\/","url_meta":{"origin":1389,"position":3},"title":"32-100 electron multiplier supply digital mode","author":"Randy","date":"November 26, 2013","format":false,"excerpt":"The model 32-100 electron multiplier supply is used on older Physical Electronics Auger electron spectroscopy and X-ray photoelectron spectroscopy surface analysis systems to control the electron multiplier voltage. When using the 32-100 electron multiplier supply in the digital mode (the software automatically sets the electron multiplier voltage)\u00a0 the auto-ems box\u2026","rel":"","context":"In "Operation and Calibration Procedures"","block_context":{"text":"Operation and Calibration Procedures","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/operation-and-calibration-procedures\/"},"img":{"alt_text":"32100-switch-positions","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2013\/11\/32100-switch-positions.jpg?fit=546%2C564&ssl=1&resize=350%2C200","width":350,"height":200},"classes":[]},{"id":113,"url":"https:\/\/www.rbdinstruments.com\/blog\/surface-analysis-techniques\/","url_meta":{"origin":1389,"position":4},"title":"Resources for Surface Analysis Techniques","author":"Randy","date":"September 18, 2012","format":false,"excerpt":"ASTM International, formerly known as the American Society for Testing and Materials (ASTM), is a fantastic resource for Surface Analysis techniques including Auger Electron spectroscopy, X-ray photoelectron spectroscopy, Secondary ion mass spectroscopy, and Energy-dispersive-ray spectroscopy. Using the search tool on the ASTM website you can easily find standards for anything\u2026","rel":"","context":"In "Theory"","block_context":{"text":"Theory","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/theory\/"},"img":{"alt_text":"","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2012\/09\/lab-directory.png?fit=836%2C585&ssl=1&resize=350%2C200","width":350,"height":200,"srcset":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2012\/09\/lab-directory.png?fit=836%2C585&ssl=1&resize=350%2C200 1x, https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2012\/09\/lab-directory.png?fit=836%2C585&ssl=1&resize=700%2C400 2x"},"classes":[]},{"id":2237,"url":"https:\/\/www.rbdinstruments.com\/blog\/how-an-electron-multiplier-works\/","url_meta":{"origin":1389,"position":5},"title":"How an electron multiplier works","author":"Randy","date":"February 6, 2018","format":false,"excerpt":"This post will explain the basic concept of how an electron multiplier works. Electron multipliers are used in surface analysis instruments to boost the detected signal to a level where it can be amplified and processed into data. For Auger Electron spectrometers and X-ray photo electron analyzers the detected signal\u2026","rel":"","context":"In "General Optics and Vacuum"","block_context":{"text":"General Optics and Vacuum","link":"https:\/\/www.rbdinstruments.com\/blog\/category\/general-optics-and-vacuum\/"},"img":{"alt_text":"continuous dynode electron multiplier gain","src":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2018\/02\/continuous-dynode-electron-multiplier-gain.jpg?fit=719%2C435&ssl=1&resize=350%2C200","width":350,"height":200,"srcset":"https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2018\/02\/continuous-dynode-electron-multiplier-gain.jpg?fit=719%2C435&ssl=1&resize=350%2C200 1x, https:\/\/i0.wp.com\/www.rbdinstruments.com\/blog\/wp-content\/uploads\/2018\/02\/continuous-dynode-electron-multiplier-gain.jpg?fit=719%2C435&ssl=1&resize=700%2C400 2x"},"classes":[]}],"_links":{"self":[{"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/posts\/1389"}],"collection":[{"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/comments?post=1389"}],"version-history":[{"count":1,"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/posts\/1389\/revisions"}],"predecessor-version":[{"id":3572,"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/posts\/1389\/revisions\/3572"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/media\/1390"}],"wp:attachment":[{"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/media?parent=1389"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/categories?post=1389"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.rbdinstruments.com\/blog\/wp-json\/wp\/v2\/tags?post=1389"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}