PHI 5400 XPS System

$ 95,000 Includes installation and training in the continental U.S., and a one year warranty.

$ 125,000 Includes a monochromator, installation, and training in the continental U.S., and a one year warranty.

5400XPSPic

Brief Description:

The basic system: Core and valence shell photoelectrons with energies characteristic of elements in the top 100 angstroms are ejected and energy analyzed to obtain qualitative and quantitative information on surface composition. The kinetic energy of the electron emitted provides information about the functional group and the oxidation state of the surface species.

With the monochromator option: Monoenergetic x-rays are focused onto the surface of a material and excite surface atoms.

Type of Information Obtained:

All elements except hydrogen and helium can be detected. Detection limits are element-specific and are typically ~0.1-1.0 atomic percent. It should be recognized that low-concentration bulk components (ppm) that migrate to a surface may be easily detected if the surface concentration exceeds our detection limit in the outermost 100 angstroms. The XPS experiment is performed in ultrahigh vacuum, so samples should be vacuum-compatible. Solids, films, powders, and fibers can be analyzed. Thin samples up to 8 inches in diameter can be studied intact. Proper handling of the sample before analysis is critical, because contamination must be avoided (fingerprints can completely mask the surface of interest).

Examples of Uses:

PHI 5400 XPS Specifications:
XPS Performance on Ag 3d5/2